Confocal Raman - AFM SNOM
WITec ALPHA300 RS
Combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and nearfield-Raman (Raman-SNOM) imaging can be easily performed.
Main instrumental features:
- Spatial resolution beyond the diffraction limit
- Ease-of-use in air and liquids
- Various Atomic Force Microscopy modes included
- Non-destructive imaging technique with minimal, if any, sample preparation
- Upgradeable with confocal Raman imaging in one microscope.