X-ray Diffractometer

X-ray Diffractometer
Rigaku, Smartlab

The Smartlab combines in a unique apparatus, the facilities of conventional θ-θ diffractometer (for phase analysis and thin films characterization) and those of an Eulerian cradle diffractometer (for pole figure and strain/stress analyses). Accurate measurements of thin film thickness, roughness and density are achievable through X-ray reflectivity (XRR) techniques. Small Angle X-ray Scattering (SAXS) will allow particle size distributions of nanoparticles suspended in solution.


Main instrumental features:

  • Automatic alignment
  • Resolution ranging from 0.05° to 0.0015° depending on the used optics
  • XRR analysis of multilayers
  • Micro diffraction geometry
  • In-plane measurements
  • SAXS and Ultra-SAXS