Confocal Raman - AFM SNOM

Confocal Raman - AFM SNOM

Combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging techniques, simultaneous Raman-AFM analysis, TERS, and nearfield-Raman (Raman-SNOM) imaging can be easily performed.


Main instrumental features:

  • Spatial resolution beyond the diffraction limit
  • Ease-of-use in air and liquids
  • Various Atomic Force Microscopy modes included
  • Non-destructive imaging technique with minimal, if any, sample preparation
  • Upgradeable with confocal Raman imaging in one microscope.